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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
System for computer measurement of transistor characteristics
 Krásl, Martin ; Šotner, Roman (referee) ; Brančík, Lubomír (advisor)
This thesis is focused on methods of measuring the characteristics of transistors in three basic connections. There is an example of the characteristic obtained from the simulator for each of the connections. Differential parameters are obtained from the resulting characteristics. These parameters describe a linearized equivalent circuit diagram of the transistor. To automate the process of obtaining characteristics, the next step of this work is the design and construction of the analyzer. The function of individual parts of the hardware is described in detail in the individual chapters. A computer application was created to control the analyzer. This application serves as the user interface. The conclusion of this thesis is a guide for a demonstration laboratory task.
Detailed record
System for computer measurement of transistor characteristics
 Krásl, Martin ; Šotner, Roman (referee) ; Brančík, Lubomír (advisor)
This thesis is focused on methods of measuring the characteristics of transistors in three basic connections. There is an example of the characteristic obtained from the simulator for each of the connections. Differential parameters are obtained from the resulting characteristics. These parameters describe a linearized equivalent circuit diagram of the transistor. To automate the process of obtaining characteristics, the next step of this work is the design and construction of the analyzer. The function of individual parts of the hardware is described in detail in the individual chapters. A computer application was created to control the analyzer. This application serves as the user interface. The conclusion of this thesis is a guide for a demonstration laboratory task.
Detailed record

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